SED-GPY-J — SED-GPY-J Handheld Alloy Analyzer

X-ray fluorescence (XRF) principle: primary X-rays from a miniature 50 kV / 100 mA / 4 W X-ray tube excite inner-shell electrons of sample atoms, creating vacancies. Outer-shell electrons transition to fill vacancies and emit characteristic X-ray fluorescence. A Si-Pin high-resolution detector (semiconductor Peltier-cooled to −35 °C, resolution <180 eV) measures the energy and intensity of the fluorescent X-rays. Software using the Fundamental Parameter (FP) method performs qualitative and quantitative analysis without requiring prior knowledge of sample composition.